Globally well-known semiconductor giant company - chip capacitor six-side appearance defect detection project
Project description:
Traditional manual detection method has low efficiency, high error rate, high cost and other disadvantages. Now, AI solutions proposed by DSTEK based on the algorithm function module of Handdle AI algorithm platform can quickly locate the defects and judge area size, greatly improving the detection efficiency and accuracy while reducing the production cost.
Defect types:
Bulges, liquid leakage, positive and negative poles, beam waist, waist distance white exposure and other adverse phenomena.
Original picture Detection picture
Continuous optimization of model Standardized software and hardware products + customized development